| Test Item | Description | Test Conditions | Duration | DUT Quantity | Reference | |||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| PreCon | Pre-conditioning |
Bake-out for 24 hrs.: TA=125℃ Moisture Soak : TA=30℃,RH=60％ for 192 hrs. Reflow : 260℃ ,3Cycles |
Executed before the following tests: C-SAM(22DUTs),TCT,PCT,H3TRB,HAST,IOL |
330 Devices | JESD22-A113 | |||||||||
| HTRB | High Temperature Reverse Bias Test | TJ=150℃, VDS=80％VDS(Specification Limit), VGS=0V | 500 Hrs | 77 Devices | JESD22 - A108 | |||||||||
| HTGB | High Temperature Gate Bias Test | TJ=150℃, VGS=100％VGS(Specification Limit), VDS=0V | 500 Hrs | 77 Devices | JESD22 - A108 | |||||||||
| PCT | Pressure Cooker /Auto-clave | TA=121℃±2℃, RH =100％,P= 15psi, Bias = None | 96 Hrs | 77 Devices | JESD22 - A102 | |||||||||
| TCT | Temperature Cycling Test | TA=-55℃~150℃, 15min each, Bias= None | 500 Cycles | 77 Devices | JESD22 - A104 | |||||||||
| H3TRB | High Humidity High Temperature Reverse Bias | TA=85℃, RH=85％,VDS=80％BVDSS(max100V) | 1000 Hrs | 77 Devices | JESD22 - A101 | |||||||||
| HAST | Highly Accelerated Stress Test | TA=130℃,RH=85％,VDS=±80%BVDSS(max42V),P=33.3psi | 96 Hrs | 77 Devices | JESD22 - A110 | |||||||||
| IOL | Intermittent Operating Life | TA=25℃, ∆TJ>100℃,2min ON / 2min OFF | 10000 Cycles | 77 Devices | MIL-STD-750 M1037 | |||||||||
| Test Item | Description | Test Conditions | Duration | DUT Quantity | Reference | |||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| PreCon | Pre-conditioning |
Bake-out for 24 hrs.: TA=125℃ Moisture Soak : TA=30℃,RH=60％ for 192 hrs. Reflow : 260℃ ,3Cycles |
Executed before the following tests: C-SAM(22DUTs),TCT,PCT,H3TRB,HAST,IOL |
330 Devices | JESD22-A113 | |||||||||
| HTRB | High Temperature Reverse Bias Test | TJ=150℃, VDS=100％VDS(Specification Limit), VGS=0V | 1000 Hrs | 77 Devices | JESD22 - A108 | |||||||||
| HTGB | High Temperature Gate Bias Test | TJ=150℃, VGS=100％VGS(Specification Limit), VDS=0V | 1000 Hrs | 77 Devices | JESD22 - A108 | |||||||||
| PCT | Pressure Cooker /Auto-clave | TA=121℃±2℃, RH =100％,P= 15psi, Bias = None | 96 Hrs | 77 Devices | JESD22 - A102 | |||||||||
| TCT | Temperature Cycling Test | TA = -55℃~150℃, 15min each, Bias= None | 1000 Cycles | 77 Devices | JESD22 - A104 | |||||||||
| H3TRB | High Humidity High Temperature Reverse Bias | TA=85℃, RH=85％,VDS=80％BVDSS(max100V) | 1000 Hrs | 77 Devices | JESD22 - A101 | |||||||||
| HAST | Highly Accelerated Stress Test | TA=130℃,RH=85％,VDS=±80%BVDSS(max42V),P=33.3psi | 96 Hrs | 77 Devices | JESD22 - A110 | |||||||||
| IOL | Intermittent Operating Life | TA=25℃, ∆TJ>100℃,2min ON / 2min OFF | 15000 Cycles | 77 Devices | MIL-STD-750 M1037 | |||||||||
| Test Item | Description | Test Conditions | Duration | DUT Quantity | Reference | |||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| PreCon | Pre-conditioning |
Bake-out for 24 hrs.: TA=125℃ Moisture Soak : TA=30℃,RH=60％ for 192 hrs. Reflow : 260℃ ,3Cycles |
Executed before the following tests: C-SAM(22DUTs),TCT,PCT,H3TRB,HAST,IOL |
3 Lots × 330Devices | JESD22-A113 | |||||||||
| HTRB | High Temperature Reverse Bias Test | TJ=175℃, VDS=100％VDS(Specification Limit), VGS=0V | 1000 Hrs | 3 Lots × 77 Devices | JESD22 - A108 | |||||||||
| HTGB | High Temperature Gate Bias Test | TJ=175℃, VGS=100％VGS(Specification Limit), VDS=0V | 1000 Hrs | 3 Lots × 77 Devices | JESD22 - A108 | |||||||||
| PCT | Pressure Cooker /Auto-clave | TA=121℃±2℃, RH =100％,P= 15psi, Bias = None | 96 Hrs | 3 Lots × 77 Devices | JESD22 - A102 | |||||||||
| TCT | Temperature Cycling Test | TA=-55℃~150℃, 15min each, Bias= None | 1000 Cycles | 3 Lots × 77 Devices | JESD22 - A104 | |||||||||
| H3TRB | High Humidity High Temperature Reverse Bias | TA=85℃, RH=85％,VDS=80％BVDSS(max100V) | 1000 Hrs | 3 Lots × 77 Devices | JESD22 - A101 | |||||||||
| HAST | Highly Accelerated Stress Test | TA=130℃,RH=85％,VDS=±80%BVDSS(max42V),P=33.3psi | 96 Hrs | 3 Lots × 77 Devices | JESD22 - A110 | |||||||||
| IOL | Intermittent Operating Life | TA=25℃, ∆TJ>100℃,2min ON / 2min OFF | 15000 Cycles | 3 Lots × 77 Devices | MIL-STD-750 M1037 | |||||||||
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